New SmartMatrix™ 3000XP Probe Card Lowers DRAM Test Costs by More than 25%

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SmartMatrix 3000XP provides 300 mm wafer testing for up to 3000 die simultaneously

SmartMatrix 3000XP provides 300 mm wafer testing for up to 3000 die simultaneously

Article from: http://www.globenewswire.com/news-release/2020/05/29/2041201/0/en/New-SmartMatrix-3000XP-Probe-Card-Lowers-DRAM-Test-Costs-by-More-than-25.html