Simultaneous Die Testing Using FormFactor’s New Probe Card

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Allows testing of up to 3000 die simultaneously from previous 1500 die testing Incorporates new custom electronics for enhanced signal integrity to enable highly parallel tests FormFactor, a semiconductor test and measurement supplier, has reached a high-throughput milestone in DRAM wafer testing with the release of the SmartMatrix 3000XP probe card. The new SmartMatrix 3000XP […]

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