ADI reveals next generation for MEMS switches for test

This post was originally published on this site

Analog Devices revealed details of its second generation of micromachined electro-mechanical relays for automated test. The aim is to provide an alternative to relays – which have good DC performance and poor RF performance – and semiconductor switches – which have poor DC performance and good RF performance – in a single device with good DC …

This story continues at ADI reveals next generation for MEMS switches for test

Or just read more coverage at Electronics Weekly