High-Reliability 3D AOI Solution For Semiconductor & Packaging Industry

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Meeting the increased miniaturisation of components, the high-resolution inspection platform enables high accuracy and reliability Test Research, Inc. (TRI), the leading test and inspection systems provider for the electronics manufacturing industry, is pleased to announce the release of the high-reliability TR77000QM SII 3D AOI. The TR7700QM SII is built on a high precision platform with […]

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